Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot ...

Intel this week revealed defect density metrics for its 18A (1.8nm-class) process technology and said that it was healthy at the Deutsche Bank's 2024 Technology Conference. The company also said that ...

Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...

(Nanowerk News) Metal-organic framework (MOF) nanocrystals are hybrid materials, built from metal clusters and organic linkers with an almost unlimited number of possible combinations. Their ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Researchers have uncovered a major cause of limitations to efficiency in a new generation of solar cells. Researchers in the materials department in UC Santa Barbara's College of Engineering have ...

Carbon materials, such as carbon fibers and activated carbons, are essential across a wide variety of fields, encompassing everything from aerospace engineering to fuel cells and thermal insulation.

Today’s commercial SiC substrates are riddled with these atomic-scale imperfections, with thousands threading through each ...

Chemical mechanical planarization (CMP) is required during semiconductor processing of many memory and logic devices. CMP is used to create planar surfaces and achieve uniform layer thickness during ...